Welcome to IOLTS 2020

Unprecedented times!

This small video is just a taste of how we wished to welcome all of you to the 2020 edition of the IOLTS in the beautiful city of Napoli in Italy!



However, the first edition of the IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS) as it moves to its second quarter century happens to be the first fully virtual one! Welcome to the 26th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS) 2020, held virtually starting Monday 13 July 2020. This is a never-to-be-forgotten year for your symposium, which maintains its enlarged scope to include all aspects of Robust System Design.

This year marks the beginning of the second quarter of a century of IOLTS life, the established on-line testing technical meeting that became a symposium in 2003. Since then, IOLTS has been held (2003 to 2018) in: Kos Island (Greece), Funchal, Madeira Island (Portugal), Saint-Raphaël, French Riviera (France), Lake of Como (Italy), Hersonissos-Heraklion, Crete (Greece), Rhodes Island (Greece), Sesimbra (Portugal), Corfu (Greece), Athens (Greece), Sitges (Spain), Chania, Crete (Greece), Platja d’Aro (Spain), Elia, Halkidiki (Greece), Sant Feliu de Guixols, (Spain), Thessaloniki (Greece), Platja d’Aro (Spain), and Rhodes Island (Greece). All previous locations offered a combination of natural beauty and vividness and created an ideal atmosphere for fertilizing the debates and inspiring new ideas and solutions. These locations continued the traditions established during the first years when the technical meeting was run as a more informal workshop from 1995 to 2002. The unique combination of beautiful landscape and active people is the major thing we will all be missing in the virtual edition of 2020.

The IEEE International On-Line Testing Workshop was created at a time when the diversity of electronic systems applications was growing rapidly. This growth, together with formidable increase in system complexity, led to an increasing need for on-line protection techniques. Thus, the need for on-line testing started to be felt beyond the traditional high RAS (Reliability Availability Serviceability) industry and new applications domains started to rely on on-line testing enabled integrated circuits to achieve market-driven dependability requirements. The elevation of the workshop to a symposium in 2003 reflected the importance of these trends.

Since then, the needs for on-line testing techniques, and more generally for design for robustness, has increased dramatically due to the drastic complexity increase of electronic systems, and more importantly, due the aggressive nanometric scaling, which impacted adversely noise margins; process, voltage, and temperature variations; aging and wear-out; soft error and EMI sensitivity; power density and heating; and made mandatory the use of design for robustness techniques for extending yield, reliability, and lifetime of modern integrated circuits. Design for reliability becomes also mandatory for low power design, as voltage reduction, often used to reduce power, strongly affects reliability by reducing noise margins and thus the sensitivity to soft-errors and EMI, as well as by increasing circuit delays and thus the severity of timing faults. There is also a strong relation between design for reliability and design for security, as security attacks are often fault-based. These issues are further exacerbated, as we enter an era of massive parallel chips that will soon comprise thousands of processor cores.

The International Symposium on On-Line Testing and Robust System Design (IOLTS) is an established forum for presenting novel ideas and experimental data on all these areas, and is recognized among those working in the field as a major forum for identifying key problems and challenges, sharing innovative ideas and unique experiences, as well as identifying effective solutions. An indication of IOLTS’ technical value for the research community is the number of citations IOLTS papers regularly receive and place IOLTS among the highest cited events in the domain of Test and Reliability.

Interestingly, as DfX techniques are proliferating (Design for Test, Design for Debug, Design for Yield, Design for Reliability, Design for Low-Power, Design for Security, Design for Verification, …), it becomes mandatory to address these issues holistically, in order to moderate their impact on area, power, and/or performance, and increase their global efficiency. There is therefore a related need for an international consolidated forum bringing together specialists from all these domains to enhance interactions and cross-fertilization.

The IOLTS 2020 technical program runs from Monday, July 13 to Wednesday and follows the high-quality technical content tradition of all previous years. It includes an outstanding keynote talk from a lead researcher is computing systems resilience: Prof. Sarita Adve from University of Illinois at Urbana-Champaign will deliver the keynote of IOLTS 2020 with title Towards Principled Error-Efficient Systems.

The 9 regular technical sessions and 1 poster session cover a wide variety of important topics: soft-errors, robustness evaluation, operating in harsh environments, design for security, error detection and correction, design for reliability and security, attacks and countermeasures, fault tolerance for autonomous applications, and lifetime management approaches. A set of 6 exciting special sessions are also organized where recognized experts in the specific topics present, elaborate, and debate on their points of view.

Despite the uncertainty of the times, a large number of papers were submitted again this year from around the globe. The importance of the topics that fall within the scope of IOLTS is getting constantly higher. Papers with authors from 20 different countries were submitted to the symposium. The IOLTS 2020 Program Committee members (well-known experts from industry and academia) reviewed the high quality submissions returning more than 90% of the assigned reviews and, as a result, each paper was thoroughly reviewed by more than five PC members on average. The quality of the technical program is a result of the high quality papers that authors submitted and the PC member’s hard work; we would like to warmly thank them all for their dedication to the symposium.

This year IOLTS is sponsored by the IEEE Council on Electronic Design Automation (CEDA), is held in technical cooperation with the IEEE Test Technology Technical Council (TTTC) and organized by the Politecnico di Torino, with the collaboration of the National and Kapodistrian University of Athens, and iRoC.

We wish you all a successful and enjoyable IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS) 2020!


Michael Nicolaidis


Dimitris Gizopoulos

    University of Athens

Stefano Di Carlo

   Politecnico di Torino


Dan Alexandrescu


General Chairs

Program Chairs