Mehdi Tahoori is a full professor and Chair of Dependable Nano-Computing (CDNC) at the Institute of Computer Science & Engineering (ITEC), Department of Computer Science, Karlsruhe Institute of Technology (KIT), Germany. He received his PhD and M.S. degrees in Electrical Engineering from Stanford University in 2003 and 2002, respectively, and a B.S. in Computer Engineering from Sharif University of Technology in Iran, in 2000. In 2003, he joined the Electrical and Computer Engineering Department at the Northeastern University as an assistant professor where he promoted to the rank of associate professor with tenure in 2009. From August to December 2015, he was a visiting professor at VLSI Design and Education Center (VDEC), University of Tokyo, Japan. From 2002 to 2003, he was a Research Scientist with Fujitsu Laboratories of America, Sunnyvale, CA, in the area of advanced computer-aided research, engaged in reliability issues in deep-submicrometer mixed-signal very large-scale integration (VLSI) designs.
He holds several pending and granted U.S. and international patents. He has authored over 250 publications in major journals and conference proceedings on a wide range of topics, from dependable computing and emerging nanotechnologies to system biology. His current research interests include nanocomputing, reliable computing, VLSI testing, reconfigurable computing, emerging nanotechnologies, and systems biology.
Prof. Tahoori was a recipient of the National Science Foundation Early Faculty Development (CAREER) Award. He has bee a program committee member, organizing committee member, track and topic chair, as well as workshop, panel, and special session organizer of various conferences and symposia in the areas of VLSI design automation, testing, reliability, and emerging nanotechnologies, such as ITC, VTS, DAC, ICCAD, DATE, ETS, ICCD, ASP-DAC, GLSVLSI, and VLSI Design. He is currently an associate editor for IEEE Design and Test Magazine (D&T), coordinating editor for Springer Journal of Electronic Testing (JETTA), associate editor of VLSI Integration Journal, and associate editor of IET Computers and Digital Techniques. He was an associate editor of ACM Journal of Emerging Technologies for Computing. He received a number of best paper nominations and awards at various conferences and journals, including ICCAD 2015 and TODAES 2017. He is the Chair of the ACM SIGDA Technical Committee on Test and Reliability.