Arnaud Virazel received the Ph.D. degree in Microelectronics from the University of Montpellier, France, in 2001. He is currently Associate Professor at the University of Montpellier, and works in the Microelectronics Department of the LIRMM (Laboratory of Informatics, Robotics and Microelectronics of Montpellier—France) where he is responsible of the TEST (“Test and dEpendability of microelectronic integrated SysTems”) team. He has published 3 books or book chapters, 40 journal papers, and more than 140 conference and symposium papers spanning diverse disciplines, including DfT, BIST, diagnosis, reliability, delay testing, power-aware testing and memory testing. He is the deputy head of the electrical engineering Master program (about 200 students) in charge of the first year and of the “Integrated Electronic Systems” specialization at the University of Montpellier. His teaching topics are mainly focusing digital circuit design, test and reliability.