Virtual Lobby


Live sessions

LIVE

July 13th, 2020 starting at:

  • 08:00AM PDT (Los Angeles,CA, USA)
  • 11:00AM EDT (New York,NY, USA)
  • 05:00PM CEST (Rome, Italy)
  • 11:00PM CST (Beijin, China)
  • 12:0012 midnight JST (Tokyo, Japan)

 

Welcome from the IOLTS General chair
Stefano Di Carlo (Politecnico di Torino) – General Co-Chair
 
Program Highlights
Dimitris Gizopoulos (University of Athens), Dan Alexandrescu (iROC Techn.) – Program Co-Chairs
 
KEYNOTE: TowardS Principled Error-efficient Systems
Sarita Adve  (Richard T. Cheng Professor of Computer Science at the University of Illinois at Urbana-Champaign)
 


Session 1 - Soft Errors

On Demand

SINGLE PHASE CLOCK BASED RADIATION TOLERANT D FLIP-FLOP CIRCUIT
Abhishek Jain (STMicroelectronics), Andrea Veggetti (STMicroelectronics), Dennis Crippa (STMicroelectronics), Antonio Benafante (STMicroelectronics), Simone Gerardin (Padova University), Marta Begatin (Padova University)
 
IN-CIRCUIT MITIGATION APPROACH OF SINGLE EVENT TRANSIENTS FOR 45NM FLIP-FLOPS
Sarah Azimi (Politecnico di Torino), Corrado De Sio (Politecnico di Torino), Luca Sterpone (Politecnico di Torino) 
 
SOFT ERROR TOLERANCE OF POWER-SUPPLY-NOISE HARDENED LATCHES
Yukiya Miura (Tokyo Metropolitan University), Yuya Kinoshita (Tokyo Metropolitan University)
 


Session 2 - Robustness Evaluation

On Demand

Representing Gate-Level SET Faults by Multiple SEU Faults at RTL
Ahmet Cagri Bagbaba (Cadence Design Systems and Tallinn University of Technology), Maksim Jenihhin (Tallinn University of Technology), Raimund Ubar (Tallinn University of Technology), Christian Sauer (Cadence Design Systems)
 
Enabling Cross-Layer Reliability and Functional Safety Assessment Through ML-Based Compact Models
Dan Alexandrescu (IROC Technologies),  Aneesh Balakrishnan (IROC Technologies and 
Tallinn University of Technology), Thomas Lange (IROC Technologies and Politecnico di Torino), Maximilien Glorieux (IROC Technologies) 
 
Machine Learning Clustering Techniques for Selective Mitigation of Critical Design Features
Thomas Lange (IROC Technologies and Politecnico di Torino), Aneesh Balakrishnan (IROC Technologies and 
Tallinn University of Technology), Maximilien Glorieux (IROC Technologies), Dan Alexandrescu (IROC Technologies), Luca Sterpone (Politecnico di Torino)
 


Session 3 - Harsh Environments

On Demand

A Framework and Protocol for Dynamic Management of Fault Tolerant Systems in Harsh Environments
Eduardo Weber Wachter (University of Essex), Server Kasap (University of Essex), Xiaojun Zhai (University of Essex), Shoaib Ehsan (University of Essex), Klaus McDonald-Maier (University of Essex)
 
A CMOS OxRAM-Based Neuron Circuit Hardened with Enclosed Layout Transistors for Aerospace Applications
Pablo Ilha Vaz (LIRMM and University of Montpellier and CNRS), Patrick Girard (LIRMM and University of Montpellier and CNRS), Arnaud Virazel (LIRMM and University of Montpellier and CNRS), Hassen Aziza (IM2NP laboratory) 
 
PISA: Power-robust Multiprocessor Design for Space Applications 
Aleksandar Simevski (IHP-Leibniz-Institut fur innovative Mikroelektronik), Oliver Schrape (IHP-Leibniz-Institut fur innovative Mikroelektronik), Carlos Benito (Arquimea Deutschland GmbH), Milos Krstic (IHP-Leibniz-Institut fur innovative Mikroelektronik and University of Potsdam) and Marko Andjelkovic (IHP-Leibniz-Institut fur innovative Mikroelektronik)
 


Session 4 - Design for Security

On Demand

A Secure Scan Controller for Protecting Logic Locking
Quang-Linh Nguyen (LIRMM), Emanuele Valea (LIRMM), Marie-Lise Flottes (LIRMM), Sophie Dupuis, Bruno Rouzeyre(LIRMM)
 
Reduced Fault Coverage as a Target for Design Scaffolding Security
Irith Pomeranz (Purdue University), Sandip Kundu (University of Massachusetts) 
 
Muon-Ra: Quantum random number generation from cosmic rays 
Homer Gamil (New York University Abu Dhabi), Pranav Mehta (New York University Abu Dhabi), Eduardo Chielle (New York University Abu Dhabi), Adriano Di Giovanni (New York University Abu Dhabi), Mohammed Nabeel (New York University Abu Dhabi), Francesco Arneodo (New York University Abu Dhabi), and Michail Maniatakos (New York University Abu Dhabi)
 


Session 5 - Novel Error Detection
and Correction Techniques

On Demand

Fast BCH 1-Bit Error Correction Combined with Fast Multi-Bit Error Detection
Christian Schulz-Hanke (University of Potsdam)
 
Encoded Check Driven Concurrent Error Detection in Particle Filters for Nonlinear State Estimation
Chandramouli N Amarnath (Georgia Institute of Technology), Md Imran Momtaz (Georgia Institute of Technology), Abhijit Chatterjee) 
 
An ECC-Based Repair Approach with an Offset-Repair CAM for Mitigating the MBUs Affecting Repair CAM
Panagiota Papavramidou (TIMA CNRS), Michael Nicolaidis (TIMA CNRS), Patrick Girard (LIRMM CNRS)
 


Session 6 - Design for Reliability
and Security

On Demand

Automatic Fault Simulators for Diagnosis of Analog Systems
Tommaso Melis (Univ. Grenoble Alpes, CNRS, TIMA), Emmanuel Simeu (Univ. Grenoble Alpes, CNRS, TIMA), Etienne Auvray (STMicroelectronics)
 
Hardware Security Vulnerability Assessment to Identify the Potential Risks in A Critical Embedded Application
Zahra Kazemi (Univ. Grenoble Alpes), Mahdi Fazeli (Bogazici University), David Hely (Univ. Grenoble Alpes), Vincent Beroulle (Univ. Grenoble Alpes) 
 
A Test Sensitization State Compaction Method on Controller Augmentation
Yuki Ikegaya (Nihon University), Toshinori Hosokawa (Nihon University), Yuta Ishiyama (Nihon University), Hiroshi Yamazaki (Nihon University)
 


Session 7 - Fault-Based Attacks
and Countermeasures

On Demand

Temporary Laser Fault Injection into Flash Memory: Calibration, Enhanced Attacks, and Countermeasures
Kathrin Garb (Fraunhofer Institute AISEC), Johannes Obermaier (Fraunhofer Institute AISEC)
 
Lightweight Protection of Cryptographic Hardware Accelerators against Differential Fault Analysis
Ana Lasheras (Universitat Politecnica de Catalunya), Ramon Canal (Universitat Politecnica de Catalunya), Eva Rodriguez (Universitat Politecnica de Catalunya), Luca Cassano (Politecnico di Milano) 
 
SCARF: Detecting Side-Channel Attacks at Real-time using Low-level Hardware Features
Han Wang (University of California), Hossein Sayadi (California State University), Setareh Rafatirad (George Mason University), Avesta Sasan (George Mason University), Houman Homayoun (University of California)
 


Session 8 - Testing and Fault Tolerance
Techniques for Autonomous Applications

On Demand

On the testing of special memories in GPGPUs
Josie E. Rodriguez Condia (Politecnico di Torino), Matteo Sonza Reorda (Politecnico di Torino),
 
Reduced-Precision DWC for Mixed-Precision GPUs
Fernando Fernandes dos Santos (UFRGS), Marcelo Brandalero (B-TU), Pedro Martins Basso (UFRGS), Michael Hubner (B-TU), Luigi Carro (UFRGS), Paolo Rech (UFRGS) 
 
Error Modeling for Image Processing Filters accelerated onto SRAM-based FPGAs
Cristiana Bolchini (Politecnico di Milano), Luca Cassano (Politecnico di Milano), Andrea Mazzeo (Politecnico di Milano), Antonio Miele (Politecnico di Milano)
 


Session 9 - Lifetime Management

On Demand

On-Chip Delay Measurement for Degradation Detection And Its Evaluation under Accelerated Life Test
Yousuke Miyake (Kyushu Institute of Technology), Takaaki Kato (Kyushu Institute of Technology), Seiji Kajihara (Kyushu Institute of Technology), Masao Aso (PRIVATECH Inc.), Haruji Futami (PRIVATECH Inc.), Satoshi Matsunaga (PRIVATECH Inc.), Yukiya Miura (Tokyo Metropolitan University)
 
Leveraging reuse and endurance by efficient mapping and placement for NVM-based FPGAs
Joao Paulo Cardoso de Lima (UFRGS), Rafael Fao de Moura (UFRGS), Luigi Carro (UFRGS) 
 
 


Posters

On Demand

Broadside ATPG for Low Power Trojans Detection using Built-in Current Sensors
Basim Shanyour (Southern Illinois University), Spyros Tragoudas (Southern Illinois University)
 
Evaluation on Hardware-Trojan Detection at Gate-Level IP Cores Utilizing Machine Learning Methods
Tatsuki Kurihara (Waseda University), Kento Hasegawa (Waseda University), Nozomu Togawa (Waseda University) 
 
 
An Anomalous Behavior Detection Method for IoT Devices by Extracting Application-Specific Power Behaviors
Kazunari Takasaki (Waseda University), Kento Hasegawa (Waseda University), Ryoichi Kida (LAC Co., Ltd.), Nozomu Togawa (Waseda University)
 
A self-scrubbing scheme for embedded systems in radiation environments
Yufan Lu (University of Essex), Xiaojun Zhai (University of Essex), Sangeet Saha (University of Essex), Shoaib Ehsan (University of Essex), Klaus McDonald-Maier (University of Essex)
 
Yield Estimation of a Memristive Sensor Array
Vishal Gupta (University of Rome “Tor Vergata”), Saurabh Khandelwal (Oxford Brookes University), Giulio Panunzi (University of Rome “Tor Vergata”), Eugenio Martinelli (University of Rome “Tor Vergata”), Said Hamdioui (Delft University of Technology), Abusaleh Jabir (Oxford Brookes University), Marco Ottavi (University of Rome “Tor Vergata”)
 
A Low Capture Power Oriented X-Identification- Filling Co-Optimization Method
Toshinori Hosokawa (Nihon University), Kenichiro Misawa (Nihon University), Hiroshi Yamazaki (Nihon University), Masayoshi Yoshimura (Kyoto Sangyo University), Masayuki Arai (Nihon University)
 
Storage Based Built-In Test Pattern Generation Method for Close-to-Functional Broadside Tests
Irith Pomeranz (Purdue University)


Special Session S1 - Dependable
Machine Learning

On Demand

Organizer: Muhammad Shafique, TU Wien

Error Resilient Machine Learning for Safety-Critical Systems: Position Paper
Karthik Pattabiraman (The University of British Columbia), Guanpeng Li (The University of British Columbia), and Zitao Chen (The University of British Columbia)
 
Dependable Deep Learning: Towards Cost-Efficient Resilience of Deep Neural Network Accelerators against Soft Errors and Permanent Faults
Muhammad Abdullah Hanif (TU Wien), Muhammad Shafique (TU Wien) 
 
 


Special Session S2 - AI in the Support
of Reliability and Functional Safety

On Demand

Organizer: Jean-Luc Bataillon, STMicroelectronics

Life-Time Prognostics of Dependable VLSI-SoCs using Machine-learning
Leila Bagheriye (University of Twente), Ghazanfar Ali (University of Twente), and Hans G. Kerkhoff (University of Twente)
 
Spiking Neuron Hardware-Level Fault Modeling
Sarah A. El-Sayed (Sorbonne Université, CNRS, LIP6), Theofilos Spyrou (Sorbonne Université, CNRS, LIP6), Antonios Pavlidis (Sorbonne Université, CNRS, LIP6), Engin Afacan (Sorbonne Université, CNRS, LIP6), Luis A. Camunas-Mesa (IMSE-CNM), Bernabe ́ Linares-Barranco (IMSE-CNM), Haralampos-G. Stratigopoulos (Sorbonne Université, CNRS, LIP6) 
 
Process to Product Reliability and Functional Safety Assessment and Management
Dan Alexandrescu (IROC Technologies), Thierry Bonnoit (IROC Technologies), Maximilien Glorieux (IROC Technologies)
 


Special Session S3: Resilience and Test
for Neural Computing

On Demand

Organizer: Muhammad Shafique, TU Wien

Defect Characterization of Spintronic-based Neuromorphic Circuits
Christopher Munch (Karlsruhe Institute of Technology), Mehdi B. Tahoori (Karlsruhe Institute of Technology)
 
High-level Modeling of Manufacturing Faults in Deep Neural Network Accelerators
Shamik Kundu (The University of Texas at Dallas), Ahmet Soyyigit (University of Missouri), Khaza Anuarul Hoque (University of Missouri), Kanad Basu (The University of Texas at Dallas)
 
Explainability and Dependability Analysis of Learning Automata based AI Hardware
Rishad Shafik (Newcastle University), Adrian Wheeldon (Newcastle University), Alex Yakovlev Newcastle University)
 


Special Session S4 - Novel Analog, RF
and Mixed Testing Breakthroughs

On Demand

Organizer: Jean-Luc Bataillon, STMicroelectronics

A Comprehensive End-to-end Solution for a Secure and Dynamic Mixed-signal 1687 System
M. Portolan (Univ. Grenoble Alpes), R. S. Feitoza (Univ. Grenoble Alpes), G. T. Tchendjou (Univ. Grenoble Alpes), V. Reynaud (Univ. Grenoble Alpes), K. S. Kannan (Univ. Grenoble Alpes), M. Barragán (Univ. Grenoble Alpes), E. Simeu (Univ. Grenoble Alpes), P. Maistri (Univ. Grenoble Alpes), L. Anghel (Univ. Grenoble Alpes), R. Leveugle (Univ. Grenoble Alpes), S. Mir (Univ. Grenoble Alpes)
 
Development and Application of Embedded Test Instruments to Digital, Analog/RFs and Secure ICs
F. Azaïs (LIRMM), S. Bernard (LIRMM), M. Comte (LIRMM), B. Deveautour (LIRMM), S. Dupuis (LIRMM), H. El Badawi (LIRMM), M.-L. Flottes (LIRMM), P. Girard (LIRMM), V. Kerzerho (LIRMM), L. Latorre (LIRMM), F. Lefèvre (NXP Semiconductors), B. Rouzeyre (LIRMM), E. Valea (LIRMM), T. Vayssade (LIRMM), A. Virazel (LIRMM)
 
Enhanced Limited Pin Test for Analog, “Towards IEEE1687 for Analog”
Mahmoud Abdalwahab (NXP Netherlands), Tom Waayers (NXP Netherlands), Willy Slendebroek (NXP Netherlands) 
 


Special Session S5 - Low Power
Design vs Robustness

On Demand

Organizer: Organizer: Patrick Girard, LIRMM/CNRS

Industrial Practices in Low-Power Robust Design
C.P. Ravikumar (Texas Instruments)
 
Leveraging CMOS Aging for Efficient Microelectronics Design
Antonio Leonel Hernández Martínez (University of Liverpool Liverpool), Saqib Khursheed (University of Liverpool Liverpool), Daniele Rossi (University of Pisa)
 
Impact of Aging on Soft Error Susceptibility in CMOS Circuits
Ambika Prasad Shah (Indian Institute of Technology Jammu), Patrick Girard (LIRMM) 
 


Special Session S6: Test, Diagnosis and
Mitigation for Automotive Applications

On Demand

Organizer: G. Harutyunyan (Synopsys) Watch session introduction

Safety-Oriented Manufacturing Test and Diagnosis Solution for Automotive SoCs
M. Casarsa (ST Microelectronics), G. Harutyunyan (Synopsys), Y. Zorian (Synopsys)
 
Full-Scale In-Field Test and Repair Solution for Automotive SoCs
Y. Abotbol (Mobileye), S. Dror (Mobileye), G. Tshagharyan (Synopsys), G. Harutyunyan (Synopsys), Y. Zorian (Synopsys)
 
Errors Mitigation in DRAMs Contributing to Safety in Automotive and Industrial Applications
G. Boschi (Intel), E. Spanò (Intel), H. Grigoryan (Synopsys), A. Kumar (Synopsys), G. Harutyunyan (Synopsys)